Claude Yugma

Professor

Center of Microelectronics in Provence, EMSE-CMP
LIMOS - UMR CNRS 6158
École des Mines de Saint-Etienne
Campus G. Charpak Provence
880 avenue de Mimet
F-13541 GARDANNE
France

• Production scheduling
• Semiconductor Manufacturing
• Automated Transport
• Simulation (Discrete-Event simulation, Agent-Based, ...)

• MASM 2013: Modeling Analysis of Semiconductor Manufacturing . MASM 2013 has been be held in Washington, DC, at the J.W. Marriott Hotel. The MASM Conference aims to be a forum for the exchange of ideas and industrial innovations between researchers and practitioners from around the world involved in modeling and analysis of complex high-tech manufacturing systems.
• IMHRC 2012: International Material Handling Research Colloquium . IMHRC 2013 has been held in Gardanne. The purpose of the Colloquium is to share worldclass research accomplishments, projects and trends in the field of material handling, facility logistics and intralogistics. It aims to facilitate dialog and collaborative research by teams of university researchers on leading edge topics of interest to end users as well as technology and solutions providers.
• ORPA2005: Operational Research Practice in Africa. Operational Research (OR) can be understood to be a range of scientific tools employed to analyse decision options. Multidisciplinary in nature, it borrows techniques from disciplines such as mathematics, computer science and economics. It is in this context that Operational Research Practice in Africa (ORPA) has emerged as a new initiative aimed at promoting the use of operational research approaches in decision-making processes in Africa. This imply actions in the continent to promote OR uses and research but also out of the continent to share experiences, take good practices wherever they are located with the idea of concrete applications in the continent. www.orpagroup.net

• Productive4.0 (2017-2020). (Coordinator S. Dauzère-Pérès). Productive4.0 is an ambitious holistic innovation project, meant to open the doors to the potentials of Digital Industry and to maintain a leadership position of the industries in Europe.

• ANR IMAGINE (2015-2018). (Coordinator Claude Yugma). Integrated MAnufacturinG decIsions for NExt generation factories. The main objective of this project is to integrate manufacturing decisions in fully automated next-generation manufacturing systems. By extensive use of product metrology data, traditional Statistical Process Control (SPC) is performed to ensure an in-control process and thus quality products. As the feature size of high-tech products is getting smaller and lighter, manufacturing processes, such as IC fabrication processes, are becoming very sensitive to disturbances and variations. Various advanced control methods have been therefore developed to further monitor tool parameters for a better control of the delicate processes. To achieve effective control, it is critical to base these control algorithms and models on the knowledge of the process physics.
• Integrate (2013-2016). (Coordinator S. Dauzère-Pérès). Integrate Solution for Agile Manufacturing in High-mix Semiconductor fabs. The objective is to develop procedures that can be implemented on existing Fab information and control system, improving the management of heterogeneous WIP and increasing the quality and processing speed of fast lots, while maximizing the total fab throughput.
• MAGE (2012-2016). (Coordinator C. Yugma). Microcontroleurs pour l’Autonomie à Grande Efficacité énergétique. L’objectif de ce projet est de développer des approches innovantes pour réduire la variabilité dans le processus de fabrication de semi-conducteurs. The quality variability of end product, should be monitored and traced back to all the process operations and the potential interactions among different operations. To control and reduce these variabilities, we have to gather together and consolidate the information generated from each operations. Consequently, the condition of the “work in process”, i.e. wafer, at each operation should be evaluated for action planning, such as the decisions of sampling for measurements or dispatching for process. Given the very diversified data sources distributed in different systems/servers, it is thus very critical to address a consolidated wafer health reference.
• ORPA2005: Operational Research Practice in Africa. www.orpagroup.net
• Nano (2010-2012). (Coordinator S. Dauzère-Pérès).
• Improve (2009-2012). (Coordinator S. Dauzère-Pérès).
• HYMNE (2005-2008). (Coordinator S. Dauzère-Pérès).

• Joris Werling (2018-2021) ). (Co-advisor A. Soukhal)
• Félicien Barhebwa (2017-2020).
• Aabir Chouichi (2016-2019). (Co-advisor J. Blue)
• Karim Tamssaouet (2016-2019). (Co-advisor S. Dauzère-Pérès)
• Katyanne Farias De Araujo (2016-2019). (Co-advisor K. Hadj-Hamou)

• Hamideh Rostami (2018).
• Moulaye Ndiaye (2018).
• Ali Ben-Salem (2018).
• Rezvan Sadeghi (2017).
• Ahmed Ben Caabane (2016).
• Sebastien Knopp (2016).
• Abdoul-Menhen Bitar (2015).
• Ali Obeid (2012).
• Justin Nduhura-Munga (2012).
• Jean-Etienne Kiba (2010).

• Management of the ISMIN (Ingénieur Spécialité Microélectronique et Informatique) - third year Computer Sciences

• Production scheduling
• Simulation
• Warehouse Management
• Lean Management

Reviewer for Journal of Scheduling, IEEE Transaction Semiconductor Manufacturing, International Journal of Production Economics, International Journal of Production Research, European Journal of Industrial Engineering, Journal of scheduling.

• Metaheuristics for the job-shop scheduling problem with machine availability constraints, K Tamssaouet, S Dauzère-Pérès, C Yugma, Computers & Industrial Engineering 125, 1-8
• Parallel Machine Scheduling with a Single Resource per Job, T Janssen, C Swennenhuis, A Bitar, T Bosman, D Gijswijt, L van Iersel, .., arXiv preprint arXiv:1809.05009
• Performance evaluation of single and multi-class production systems using an approximating queuing network , M Mohammadi, S Dauzère-Pérès, C Yugma, International Journal of Production Research, 1-27
• Automatic equipment fault fingerprint extraction for the fault diagnostic on the batch process data, H Rostami, J Blue, C Yugma, Applied Soft Computing 68, 972-989
• Heterogranular multivariate analytics for detecting and controlling the root causes of the mismatching machines in semiconductor manufacturing, A Chouichi, J Blue, C. Yugma, F Pasqualini, SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2018 29th …
• A Branch-and-Cut Algorithm for a Two-Echelon IRP, K Farias, K Hadj-Hamou, C Yugma, 19ème Conférence de la Société Française de Recherche Opérationnelle et d’Aide à la Décision
• Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing, Hamideh Rostami ; Jakey Blue ; Argon Chen ; Claude Yugma, 2018 IEEE 14th International Conference on Automation Science and Engineering (CASE)
• Minimizing makespan on parallel batch processing, K Tamssaouet, S Dauzère-Pérès, C Yugma, International Conference on Project Management Scheduling

• A simulation-Based approach for an effective AMHS design in a legacy semiconductor manufacturing facility, A Ben-Salem, C Yugma, E Troncet, J Pinaton, Simulation Conference (WSC), 2017 Winter, 3600-3611
• Equipment Health Diagnosis and Prognosis using a Wavelet-based Windowing Approach in Semiconductor Manufacturing, H Rostami, J Blue, C Yugma, Advanced Process Control Conference
• Equipment health modeling for deterioration prognosis and fault signatures diagnosis, H Rostami, J Blue, C Yugma, J Pinaton, Information and Communication Technology, Electronics and Microelectronics
• Equipment Deterioration Prognosis and Fault Diagnosis in Semiconductor Manufacturing, H Rostami, J Blue, C Yugma, European advanced process control and manufacturing (apc| m) Conference
• Multi-echelon Inventory-Routing Problem: modèles et solutions, K Farias, K Hadj-Hamou, C Yugma, 18ème Conférence de la Société Française de Recherche Opérationnelle et d’Aide à la Decision
• A Batch-oblivious Approach For Scheduling Complex Job-Shops with Batching Machines: From Non-delay to Active Scheduling, K Tamssaouet, S Dauzère-Pérès, C Yugma, J Pinaton, 8th Multidisciplinary International Conference on Scheduling
• A tabu search approach for the Job-shop scheduling with availability constraints, K Tamssaouet, S Dauzère-Pérès, C Yugma, J Pinaton, Joint EURO/ORSC/ECCO conference on Combinatorial Optimization

• Equipment condition diagnosis and fault fingerprint extraction in semiconductor manufacturing, H Rostami, J Blue, C Yugma, 2016 15th IEEE International Conference on Machine Learning and Applications
• Equipment anomaly detection and automatic fault fingerprint extraction in semiconductor manufacturing, H Rostami, J Blue, C Yugma, Procedding of International Symposium on Semiconductor Manufacturing
• A memetic algorithm to solve an unrelated parallel machine scheduling problem with auxiliary resources in semiconductor manufacturing, A Bitar, S Dauzère-Pérès, C Yugma, R Roussel, Journal of Scheduling 19 (4), 367-376
• AMHS design for reticles in photolithography area of an existing wafer fab: IE: Industrial engineering, A Ben-Salem, C Yugma, E Troncet, J Pinaton, 2016 Advanced Semiconductor Manufacturing Conference (ASMC)
• Management of crisis situations in a large unified AMHS of a semiconductor manufacturing facility: IE: Industrial engineering, MA Ndiaye, S Dauzère-Pérès, C Yugma, L Rullière, G Lamiable, 2016 27th Annual Advanced Semiconductor Manufacturing Conference (ASMC)
• A multi-method simulation modelling for semiconductor manufacturing, R Sadeghi, S Dauzere-Pérès, C Yugma, IFAC-PapersOnLine 49 (12), 727-732

• How to Maintain the Network Resilience and Effectiveness in Case of Resources Reduction? A Covering Set Location Approach, L Dupont, M Lauras, C Yugma, Working Conference on Virtual Enterprises, 136-145
• Scheduling jobs on parallel machines with qualification constraints, L Mönch, C Yugma, 2015 IEEE International Automation Science and Engineering (CASE)
• Production control in semiconductor manufacturing with time constraints, R Sadeghi, S Dauzère-Pérès, C Yugma, G Lepelletier, 2015 26th annual Advanced semiconductor manufacturing conference (ASMC)
• Flexible Job-Shop Scheduling with Batching for Semiconductor Manufacturing, S Knopp, S Dauzère-Pérès, C Yugma, 6ème conférence de la Société Française de Recherche Opérationnelle et Aide à la Décision
• Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook, Claude Yugma, Jakey Blue, Stéphane Dauzère-Pérès, Journal of Scheduling 18 (2), 195-205
• On the importance of optimizing in scheduling: The photolithography workstation, A Bitar, S Dauzère-Pérès, C Yugma, Proceedings of the 2014 Winter Simulation Conference, 2561-2570
• Flexible job-shop scheduling with extended route flexibility for semiconductor manufacturing, S Knopp, S Dauzère-Pérès, C Yugma, Simulation Conference (WSC), 2014 Winter, 2478-2489
• A mathematical programming approach for optimizing control plans in semiconductor manufacturing, JN Munga, S Dauzère-Pérès, C Yugma, P Vialletelle, International Journal of Production Economics 160, 213-219

• Managing Capacity Production with Time Constraints in Semiconductor Manufacturing, S Rezvan, S Dauzere-Peres, C Yugma, R Sarraj, ROADEF-15ème congrès annuel de la Société française de recherche et d’Aide à la Décision
• Utilisation d'une fonction d'agrégation pour l'optimisation bicritère d'un problème d'ordonnancement avec contraintes de ressources auxiliaires et de setup, A Bitar, C Yugma, S Dauzere-Peres, ROADEF-15ème congrès annuel de la Société française de recherche et d’Aide à la Décision
• Sélection de lots pour mesures de défectivité en fabrication microélectronique, S Housseman, G Rodriguez-Verjan, S Dauzère-Pérès, C Yugma ROADEF-15ème congrès annuel de la Société française de recherche et d’Aide à la Décision
• Generalized Job Shop Scheduling for the Diffusion Area in Semiconductor Manufacturing, S Knopp, C Yugma, S Dauzère-Pérès, ROADEF-15ème congrès annuel de la Société française de recherche et d’Aide à la Décision
• Scheduling job families on non-identical parallel machines with time constraints, CY Ali Obeid, Stéphane Dauzère-Pérès, Annals OR 213 (1), 221-234

• • A literature review on sampling techniques in semiconductor manufacturing, J Nduhura-Munga, G Rodriguez-Verjan, S Dauzere-Peres, C Yugma, IEEE Transactions on Semiconductor Manufacturing 26 (2), 188-195
• • Analyzing the impact of key parameters of vehicle management policies in a unified AMHS, AB Chaabane, S Dauzère-Pérès, C Yugma, L Rullière, G Lamiable, Simulation Conference (WSC), 2013 Winter, 3818-3828
• • Modeling complex processability constraints in high-mix semiconductor manufacturing, AB Amira, G Lepelletier, P Vialletelle, S Dauzère-Pérès, C Yugma, Proceedings of the 2013 Winter Simulation Conference
• • Modeling complex processability constraints in high-mix semiconductor manufacturing, AB Amira, G Lepelletier, P Vialletelle, S Dauzère-Pérès, C Yugma, Proceedings of the 2013 Winter Simulation Conference
• • Generalized covering location problem with multiple-coverage: Exact and heuristic method, L Dupont, M Lauras, C Yugma, IFAC Proceedings Volumes 46 (9), 442-447

• Industrial implementation of a dynamic sampling algorithm in semiconductor manufacturing: Approach and challenges, JN Munga, S Dauzère-Pérès, P Vialletelle, C Yugma, Proceedings of the Winter Simulation Conference
• Scheduling on parallel machines with time constraints and equipment health factors, A Obeid, S Dauzère-Pérès, C Yugma, IEEE International Conference on Automation Science and Engineering (CASE)
• A Study on Storage Allocation in an Automated Semiconductor Manufacturing Facility, S Dauzere-Péres, C Yugma, AB Chaabane, L Rullière, G Lamiable, Proceeding of the 2012 International Material Handling Research Colloquium
• An exact approach for scheduling jobs with regular step cost functions on a single machine, B Detienne, S Dauzère-Pérès, C Yugma, Computers & Operations Research 39 (5), 1033-1043
• A batching and scheduling algorithm for the diffusion area in semiconductor manufacturing, C Yugma, S Dauzère-Pérès, C Artigues, A Derreumaux, O Sibille, International Journal of Production Research 50 (8), 2118-2132
• Optimisation des contrôles dans la fabrication des semiconducteurs, JN Munga, S Dauzère-Pérès, C Yugma, P Vialletelle, ROADEF (13ème congrès annuel de la société française de Recherche Operationnelle et d’Aide à la Décision

• Novel models and approaches for semiconductor manufacturing, S Dauzère-Pérès, C Yugma, SC Sarin, Production Planning and Control 22 (1), 1-3
• Optimized Management of Controls in Semiconductor Manufacturing, J Nduhura-Munga, S Dauzere-Péres, P Vialletelle, C Yugma, Winter Simulation Conference-Session: Modeling and Analysis of Semiconductor Manufacturing
• Scheduling job families on non-identical parallel machines with time constraints, A Obeid, S Dauzère-Pérès, C Yugma, Proceedings of the Winter Simulation Conference, 1999-2010
• Scheduling job families on non-identical parallel machines with time constraints, A Obeid, S Dauzère-Pérès, C Yugma, Proceedings of the Winter Simulation Conference, 1999-2010
• A smart sampling scheduling and skipping simulator and its evaluation on real data sets • C Yugma, S Dauzère-Pérès, JL Rouveyrol, P Vialletelle, J Pinaton, Proceedings of the Winter Simulation Conference, 1908-1917
• Scheduling jobs on parallel machines to minimize a regular step total cost function, B Detienne, S Dauzère-Pérès, C Yugma, Journal of Scheduling 14 (6), 523-538
• Scheduling job families on parallel machines with a bi-criteria objective function under time constraints, A Obeid, S Dauzère-Pérès, C Yugma, Multi-disciplinary International Scheduling Conference
• Batching, Scheduling, Disjunctive graph, Local search, Simulated Annealing, Wafer fabrication, C Yugma, S Dauzere-Peres, C Artigues, A Derreumaux, O Sibille, International Journal of Production Research
• A mathematical programming approach for determining control plans in semiconductor manufacturing, JN Munga, S Dauzère-Pérès, C Yugma, P Vialletelle, 4th International Conference on Industrial Engineering and Systems Management International Conference on Industrial Engineering and Systems
• A mathematical programming approach for determining control plans in semiconductor manufacturing, JN Munga, S Dauzère-Pérès, C Yugma, P Vialletelle, 4th International Conference on Industrial Engineering and Systems

• A Novel Approach to Minimize the number of Controls in Defectivity Area, JN Munga, C Yugma, S Dauzere-Péres, P Vialletelle, 13th Technical Meeting of ARCSIS, Rousset 2010
• A smart sampling algorithm to minimize risk dynamically, S Dauzere-Péres, JL Rouveyrol, C Yugma, P Vialletelle, Advanced semiconductor manufacturing conference (ASMC), 2010 IEEE/SEMI, 307-310
• Simulated annealing for scheduling job families on non-identical parallel machines with information constraints, A Obeid, S Dauzère-Pérès, C Yugma, EU/MEeting 2010
• Scheduling job families on non identical parallel machines under Run-To-Run control constraints, A Obeid, S Dauzere-Péres, C Yugma, A Ferreira, 12th International Conference devoted to Project Management and Scheduling